UHV-FT-IR article in the journal "Spectroscopy"
The scientific journal "Spectroscopy" has published the special issue "FT-IR Technology for Today's Spectroscopists" in August 2013 which reports an innovative UHV-FT-IR apparatus combining a Bruker VERTEX 80v spectrometer and a UHV-system for high sensitive analysis of functional surfaces. Read here the complete article.
