Defects and contaminations in manufactured products analyzed by FT-IR microscopy
Defects that cause failure of industrial products are often too small to be accessible with standard FT-IR spectroscopy. Modern FT-IR microscopes allow the analysis of sample areas down to about 5 µm at an extreme comfortable workflow. Application note AN101 shows the identification of a contamination in a plastic product. The flyer Quality Control and Failure Analysis of Plastics highlights the benefit of ALPHA and LUMOS for manufacturers of plastics.
