Introduction of new SiBrickScan Analyzer
The new Bruker SiBrickScan (SBS) is the first commercially available FT-IR at-line instrument allowing for the quantification of interstitial Oxygen in complete Silicon bricks and ingots. Since Silicon is by far the most important semiconductor material in electronics and photovoltaics, Bruker is proud to introduce the SBS system as a big step forward e.g. for Si wafer producers. In contrast to classical FT-IR approaches SBS does not require to prepare thin test samples but directly determines the Oxygen gradient along the ingot main axis and thus helps to implement fast and economic quality control. Learn more about the new SiBrickScan in our related product information.
